The EPOCH® 6LT flaw detector was designed with a focus on ergonomics, portability, and simplicity. With a lightweight form factor optimized for one-handed operation and all of the core functionality of the EPOCH 650 flaw detector, rope access technicians and other users requiring high portability finally have an instrument that doesn't compromise power for ergonomics.
For more information, visit: www.olympus-ims.com/EPOCH6LT
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About our products Leading edge testing technologies include remote visual inspection (RVI), microscopy (IE), ultrasound (UT), phased array (PA), eddy current (EC), eddy current array (ECA), X-ray fluorescence (XRF) and optical metrology. Our products include ultrasonic flaw detectors and thickness gages, videoscopes, borescopes, microscopes, in-line and advanced nondestructive testing systems, XRF and XRD analyzers, interferometers, and a large selection of industrial scanners, probes, software programs, and instrument accessories.
Olympus has an extensive portfolio of inspection solutions that offer unmatched capability for applications ranging from weld inspections to the detection of hidden cracks, voids, porosity and other internal irregularities in metals, composites, plastics and ceramics. Our high quality inspection solutions offer numerous practical measurement features, application-specific software, ease-of-use, versatility, and ruggedness.
Optical microscopes are microscopes that typically use visible light and a system of lenses to magnify images of small samples. Industrial microscopes incorporate many complex designs that aim to improve resolution and sample contrast. Images from an optical microscope can be captured by normal light-sensitive cameras to generate a micrograph. Modern developments in CMOS and charge-coupled device (CCD) cameras allow the capture of digital images. Digital microscopes are available with a CCD camera to examine a sample, and the image is shown directly on a computer screen without the need for eye-pieces.
Our X-ray Fluorescence (XRF) and X-ray Diffraction (XRD) Analyzers provide qualitative and quantitative material characterization for detection, identification, analysis, quality control, process control, regulatory compliance, and screening, for metals and alloys, mining and geology, scrap and recycling, environmental and consumer safety, education and research, and general manufacturing.
We are the leading source of thickness gages for the accurate measurement of nearly any material. Thickness gages include a wide range of features available for enhanced gage performance. Ultrasonic thickness gauges can measure virtually most materials such as plastics, metals, metal composites, rubber and internally corroded materials.
Olympus continually strives to innovate in the development of high-speed inspection systems that adhere to the highest international quality standards, without any compromise to productivity. The Olympus Systems business unit primarily focuses its efforts on developing and delivering industrial inspection system solutions capable of inspecting long metal products, such as bars, billets, wires-rods, and tubes.