IONTOF

On our YouTube channel we will provide information about Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) and Low Energy Ion Scattering (LEIS).

About IONTOF GmbH:
IONTOF is a manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight secondary ion mass spectrometry (TOF-SIMS) and high-sensitivity low-energy ion scattering (LEIS). Founded as a classical spin-off of the University of Münster, IONTOF has meanwhile become the technological leader in the field of TOF-SIMS and LEIS instrumentation.

The company was founded by Prof. Alfred Benninghoven, Dr. Ewald Niehuis and Mr. Thomas Heller in 1989 to commercialise the original research carried out by Prof. Benninghoven and his team at the University of Muenster in Germany from the early 80's. Since the technique became commercially viable IONTOF has made many product improvements and more than 350 instruments are in operation in industrial and academic laboratories worldwide.