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nanoHUB-U Fundamentals of AFM L3.1: AFM-The Instrument - The Water Meniscus

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Published on Jun 2, 2014

Table of Contents:
00:09 Lecture 3.1: Tip-Sample Interactions: the Water Meniscus
01:16 Week 3 Overview
01:51 The asymmetry in number density at a liquid-vapor surface gives rise ...
03:40 The "Curvature" of a Liquid's Surface has far reaching consequences
06:36 Implications of the Young‐Laplace Equation
07:12 2. It may not be so obvious, . . . but if the surface of a liquid is ...
09:24 Application to AFM
11:21 How thick is h? (measured thickness of water layer on a silicon ...
12:47 At contact - what determines R1, R2?
13:46 Results for water meniscus
15:48 Conclusion: A capillary meniscus force binds a sphere to a flat plane
18:24 Estimate magnitude of capillary force (see Appendix 4 for ...
23:09 Effect of capillary condensation -- important modifications to the ...
23:57 Next Lecture: An overview of VEDA -- the online AFM simulation ...


This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 1 Fundamental Aspects of AFM. (https://nanohub.org/courses/AFM1)

Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.

The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.

Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.

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