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nanoHUB-U Fundamentals of AFM L3.3: AFM-The Instrument - AFM Components

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Published on Jun 2, 2014

Table of Contents:
00:09 Lecture L3.3: AFM Components
01:30 What's special about an AFM?
02:22 The Atomic Force Microscope: Paper 001
02:58 Why the AFM Works
05:08 Commercially available microcantilever force transducers
06:05 Detecting Deflection
07:01 Notation: Cantilever Dimensions
08:32 Detecting Cantilever Deflection with a Segmented Photodiode
13:26 Maintaining a constant force
15:23 Principle of Feedback: controlled modification of a dynamical system
17:21 Need to Minimize Thermal Drift
18:42 Reducing Floor Vibrations
20:36 Achieving Vibrationless Motion at the Nanoscale
21:48 Piezoelectric Creep and Hysteresis
23:10 Flexure Scanners/Nanopositioning Stages
24:27 Closed Loop Scanners -- Linearized Scanning
25:02 Important Electrical Signals
25:05 Up Next: AFM Calibration


This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 1 Fundamental Aspects of AFM. (https://nanohub.org/courses/AFM1)

Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.

The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.

Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.

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