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Published on Jun 2, 2014
Table of Contents: 00:09 Lecture L3.3: AFM Components 01:30 What's special about an AFM? 02:22 The Atomic Force Microscope: Paper 001 02:58 Why the AFM Works 05:08 Commercially available microcantilever force transducers 06:05 Detecting Deflection 07:01 Notation: Cantilever Dimensions 08:32 Detecting Cantilever Deflection with a Segmented Photodiode 13:26 Maintaining a constant force 15:23 Principle of Feedback: controlled modification of a dynamical system 17:21 Need to Minimize Thermal Drift 18:42 Reducing Floor Vibrations 20:36 Achieving Vibrationless Motion at the Nanoscale 21:48 Piezoelectric Creep and Hysteresis 23:10 Flexure Scanners/Nanopositioning Stages 24:27 Closed Loop Scanners -- Linearized Scanning 25:02 Important Electrical Signals 25:05 Up Next: AFM Calibration
Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.
The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.
Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.