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Published on Jun 2, 2014
Table of Contents: 00:09 Lecture 2.3: Connecting Surface Energies to Hamaker Constants ... 01:12 Surface Energetics 01:44 (Excess) Surface Energy 02:43 Recall the Molecule-Plane Interaction 03:41 The Plane-Plane Interaction 05:50 Typical Values for Hamaker Constant 07:22 How strong is the vdW surface force? 12:21 Estimating the surface energy due to vdW forces 13:46 The Derjaguin approximation 16:27 Likewise, it can be shown that for two interacting sphere of different ... 17:29 Example 18:41 Implications of Derjaguin's approximation
Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.
The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.
Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.