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Published on Jun 2, 2014
Table of Contents: 00:09 Lecture 5.3: Contact Mode Scanning Simulations with VEDA 00:44 The Purpose of a Microscope is to Obtain an Image 02:35 The Coarse Approach 03:07 The AFM Feedback Loop 04:00 Contact Mode Scanning in VEDA 05:31 Under 4: Tip-sample interact. Prop: Feature Select "Step" 06:03 Example 1: 09:13 Echo Input File 10:46 Tip Speed 12:16 Result of Simulation 14:50 Mean Interaction Force 17:05 Measurement Error: 17:57 Can we do better? 19:18 What if you include the finite radius of the tip? 21:01 Results of tip convolution on topography 22:42 Up Next: More Contact Mode Scanning Examples
Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.
The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.
Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.