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Published on Jun 2, 2014
Table of Contents: 00:09 Lecture 3.2: Introduction to VEDA 00:53 Virtual Environment for Dynamic AFM (VEDA) 02:08 AFM Numerical Simulations - VEDA Overview 03:33 Using VEDA 04:37 Using VEDA 04:46 Using VEDA 05:22 After Launching VEDA, the following screen should appear 06:19 1. Select "tip-sample force viewer" application 08:31 The "Tip-sample interaction properties" tab 10:59 4. Click back to change input values 12:55 Compare Hertz to DMT 14:20 Example Results: Hertz compared to DMT 16:33 Replotting/Rescaling Plots 16:56 Crosshair -- Obtaining Exact Numbers from Plots 17:24 Zoom-in Plots 17:54 VEDA Summary Flowchart 19:37 Up Next: AFM Design
Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.
The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.
Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.