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nanoHUB-U Fundamentals of AFM L3.5: AFM-The Instrument - Contact Mode Scans

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Published on Jun 2, 2014

Table of Contents:
00:09 Lecture 3.5: Contact Mode Scans
00:38 The Purpose of a Microscope is to Obtain an Image
02:20 Contact Mode AFM
04:34 Overcoming Inherent Barriers
06:15 Steps for Contact Mode Scanning - Overview
06:57 Good sample preparation is crucial
08:01 Positioning the Laser
09:32 The Coarse Approach
11:14 Optimizing the Feedback Loop
11:41 The AFM Feedback Loop
15:27 Typical Feedback Loop Response to a Step Change
18:05 The classic Ziegler-Nichols Tuning Rule -- one example
19:37 Trends
21:02 Why a tuning rule may not work
21:58 What actually occurs
23:46 An Empirical Procedure for Setting KP and KI
24:14 Once you have the image -- need versatile data processing software
25:33 Many Applications
26:25 Up Next: The AFM as a System

This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 1 Fundamental Aspects of AFM. (https://nanohub.org/courses/AFM1)

Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.

The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.

Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.

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