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Published on Jun 2, 2014
Table of Contents: 00:09 Lecture 3.5: Contact Mode Scans 00:38 The Purpose of a Microscope is to Obtain an Image 02:20 Contact Mode AFM 04:34 Overcoming Inherent Barriers 06:15 Steps for Contact Mode Scanning - Overview 06:57 Good sample preparation is crucial 08:01 Positioning the Laser 09:32 The Coarse Approach 11:14 Optimizing the Feedback Loop 11:41 The AFM Feedback Loop 15:27 Typical Feedback Loop Response to a Step Change 18:05 The classic Ziegler-Nichols Tuning Rule -- one example 19:37 Trends 21:02 Why a tuning rule may not work 21:58 What actually occurs 23:46 An Empirical Procedure for Setting KP and KI 24:14 Once you have the image -- need versatile data processing software 25:33 Many Applications 26:25 Up Next: The AFM as a System
Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.
The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.
Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.