 This study investigated the evolution of residual strain in organic inorganic hybrid perovskite, OHP, polycrystalline thin films during the anti-solvent spin coating process. It was found that the residual strain evolved with time and its distribution changed significantly during the process. A mechanical model was developed to explain the evolution of the residual strain, which was attributed to the crystal growth rate and the crystal size. This study provides valuable insights into the crystallization kinetics-induced residual strain evolution process in OHP polycrystalline thin films, which can be used to optimize the spin coating process and improve the performance of OHP devices. This article was authored by Y Sun, Q Yao, W Xing, and others.