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Published on Jun 2, 2014
Table of Contents: 00:09 Lecture: 1.3: Inter-Molecular Forces: Physical Models 00:42 Charges in the microscopic world 02:40 Electrostatic Potential Energy 04:15 Electrostatic Potential Energy - Examples 07:05 Atomic structure of a few common solvent molecules 07:46 Experimental identification of (di)polar and non-(di)polar molecules 09:04 Relevant properties of a few common solvent molecules 11:13 Overview: Electrostatic Intermolecular Interactions 11:55 1. Ion-ion interactions 14:32 Polar Molecules 16:44 2. Ion -Dipole Interactions 19:16 Interaction energy 21:36 Ion-Dipole Example 23:01 If ion and dipole are not permanently fixed in space, how do we ...
Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.
The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.
Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.