Product Screencast NANOSENSORS™ Magnetic Force Microscopy probes

Product Screencast on the NANOSENSORS™ Magnetic Force Microscopy Silicon MFM Probes held by head of R&D Thomas Sulzbach.

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For visualisation of magnetic domains by Scanning Probe Microscopy different Magnetic Force Microscopy probes are offered. They are designed to match the demands of a wide range of applications defined by the variety of magnetic samples with different properties. All the different magnetic coatings of the probes have proven an excellent long-term stability.

The NANOSENSORS™ Magnetic Force Microscopy probes are based on a well-established cantilever type that is specially tailored for the Magnetic Force Microscopy yielding high force sensitivity while simultaneously enabling Tapping Mode, Non-Contact and Lift Mode operation in air. In particular, the stiffness of the cantilever is a tradeoff between preventing the tip snapping to the surface during Tapping Mode or Non-Contact Mode operation and sensitivity to magnetic forces during Lift Mode operation.

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