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Published on Jun 2, 2014
Table of Contents: 00:09 Lecture 4.5: Modulus and Adhesion Maps 00:44 AFM enables a new class of experiments 02:33 Force vs. Displacement experiment 03:58 A. Force vs. Time 04:59 The Idea: Modulus and Adhesion Maps 07:00 Write software that automatically measures quantities of interest 08:25 Simple Test (circa 1998): Au Bridge Connected to Contact Pads 10:49 State of the art (circa 2010): Cellulose NanoCrystal (CNC) on mica 12:09 State of the art (circa 2011): Steps along the way 13:31 State of the art (circa 2011): Typical Data 15:15 State of the art (circa 2011): Modulus and Adhesion Maps 17:28 Up Next: Lateral Force Microscopy
Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.
The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.
Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.