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nanoHUB-U Fundamentals of AFM L4.2: Force Spectroscopy - The Approach Curve

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Published on Jun 2, 2014

Table of Contents:
00:09 Lecture 4.2: The Approach Curve
00:51 The AFM co-ordinate system
01:59 Measuring Force vs. z-displacement
08:22 Jump to Contact
11:27 Force vs. Separation Curve
14:11 The pull off force feature
16:06 Review: Adhesion and the DMT Model
16:57 Stiffer Cantilever
19:23 How Stiff of a Cantilever is Required?
21:16 The Sample Could Deform!
22:42 Up Next: Jump to Contact

This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 1 Fundamental Aspects of AFM. (https://nanohub.org/courses/AFM1)

Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.

The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.

Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.

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