 This paper presents a novel method for fabricating two-dimensional, 2D, semi-conductors on large-scale substrates. The technique involves combining large area physical growth of 2D materials with high-resolution thermal-scanning probe lithography to reshape the ultra-thin semi-conducting layers at the nanoscale level. The resulting 2D semi-conductors exhibit distinctive optical and electrical characteristics, which can be used to identify individual nanostructures. Furthermore, this method enables the fabrication of 2D semi-conducting interconnects, which could be used to build deterministic 2D semi-conducting circuits. This article was authored by Maria Caterina Giordano, Giorgio Zambito, Matteo Gardella, and others.