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nanoHUB-U Fundamentals of AFM L4.5: Reconstructing Surface Forces - Experimental Results in FM-AFM

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Published on Jun 2, 2014

Table of Contents:
00:09 Lecture 4.5: Key Experimental Results in FM-AFM II
00:31 From the last lecture
00:55 Atomic resolution force spectroscopy with FM-AFM
07:47 Surface binary alloys -- an aside
09:48 Atomic resolution imaging of binary alloys
12:42 Force spectroscopy on different atoms
14:59 Identifying atoms based on force "fingerprints"
19:22 3D reconstruction of forces
23:28 3D Force reconstruction at liquid solid interfaces?

This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 2 Dynamic AFM Methods. (https://nanohub.org/courses/AFM2)

Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.

The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.

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