Presented on May 28, 2015 by Dr. Donna Hurley, Lark Scientific and Dr. Anna Kepas-Suwara, Tun Abdul Razak Research Centre (TARRC)
Whether investigating fundamental research principles or engineering a specific product, the atomic force microscope (AFM) is a key instrument for evaluating polymers and polymer blends. Its spatial resolution enables visualization of sub-micrometer and sub-nanometer morphology and structure. However, recent advances mean that AFMs can also measure the physical properties and functional behavior of polymers at small length scales. In addition to familiar topographic imaging, AFMs can probe molecular-level forces; map mechanical, thermal, and electrical properties; and assess solvent and thermal effects in near real time. This webinar provides an overview of the AFM’s powerful capabilities for polymers characterization and will cover:
• AFM methods for fast topographic imaging, even in liquids and at high temperatures
• Recent advances in viscoelastic measurements
• Nanomechanical mapping of rubber blends
• AFM techniques to probe electrical and functional behavior
