Dr. John Butler is currently a NIST Fellow and Group Leader of Applied Genetics in the Biochemical Science Division at the National Institute of Standards and Technology. He is a regular invited guest of the FBI's Scientific Working Group on DNA Analysis Methods and a member of the Department of Defense Quality Assurance Oversight Committee for DNA Analysis. Following the terrorist attacks of September 11, 2011 he aided the DNA identification efforts. He is a member of the International Society of Forensic Genetics and serves as an Associate Editor for Forensic Science International.
Dr. Butler has received numerous awards including the Presidential Early Career Award for Scientists and Engineers (2002), the Department of Commerce Gold Medal (2008), and the Scientific Prize of the International Society of Forensic Genetics (2003).
He has more than 100 publications describing aspects of forensic DNA testing and is one of the most prolific active authors in the field. Dr. Butler has been an invited speaker to numerous national and international forensic DNA meetings.
In addition to his busy scientific career, John Butler and his wife serve in their community and church and are the proud parents of six children, all of whom have been proven to be theirs through the power of DNA typing.
