 X-ray photoelectron spectroscopy, XPS, is a valuable tool for studying the chemical modification of surfaces, particularly in carbon nanomaterials such as graphene and carbon nanotubes. Dopants like nitrogen, boron, and phosphorus are commonly studied to modify these materials intrinsic properties for specific applications. Hundreds of studies have used XPS to analyze dopant concentration and bonding in various materials, but more work is needed to identify precise atomic bonding configurations. Careful sample preparation, consideration of the materials intrinsic photoemission response, and appropriate spectral analysis are necessary to avoid incorrect conclusions. This review provides a practical guide for interpreting XPS spectra of doped graphitic carbon nanomaterials and serves as a reference for their binding energies vital for compositional analysis via XPS. This article was authored by Thomas Suzy, Thomas Pitchler, and Paula Ayala. We are article.tv. Links in the description below.