 The FEI Titan G280-200 Krulli is a powerful transmission electron microscope capable of investigating a wide range of solid-state phenomena on the atomic scale. It features a shocky type high-brightness electron gun, a CS probe corrector, an in-column SuperX energy dispersive x-ray spectrometer, a post-column energy filter system, an angular dark field scanning TEM detector, on-axis triple beam detectors, and a 4 megapixel CCD system. This instrument can be used to study materials such as semiconductors, nanostructures, thin films, and other materials with atomic resolution. This article was authored by Andres Kovacs, Roland Schierholz, and Karsten Tillman.