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Published on Jul 1, 2013
The study of nanostructured materials requires analytical methods that combine X-ray spectroscopy with electron microscopy. The Nanospectroscopy beamline at Elettra operates a state-of-the-art spectroscopic photoemission and photoemission electron microscope (SPELEEM). This powerful instrument offers a wide range of complementary methods including low energy electron microscopy (LEEM) providing structural, chemical and magnetic sensitivity. The lateral resolution of the microscope currently approaches few tens nm. The microscope is served by a high photon flux beamline, which can deliver elliptically polarised photons in the range 50 eV to 1000 eV. Research applications are targeted to Surface and Materials Sciences, addressing issues related to chemical and magnetic characterization of surfaces, interfaces, thin films, and nanostructures.