nanoHUB-U Fundamentals of AFM L3.4: AFM-The Instrument - AFM Calibrations





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Published on Jun 2, 2014

Table of Contents:
00:09 Lecture 3.4: AFM Calibrations
00:33 Four Calibrations
01:41 How do you know the spring constant of the cantilever?
03:45 Why the variability in k?
06:02 Recent Study Involving Ten Different AFMs
07:27 Remaining Issues for Careful Work
10:00 Calibration of the sensitivity S of the optical system
14:36 Calibration and orthogonality of X and Y scanners
16:40 Non-linearity in the X and Y piezo scanners
18:17 X-Z and Y-Z coupling of scanners
20:59 Calibration of Z piezo
22:57 Non-linearity in the z-piezo
24:28 Important Issue: AFMs located in multi-user central facilities
25:49 Up Next: Contact Mode Scans

This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 1 Fundamental Aspects of AFM. (https://nanohub.org/courses/AFM1)

Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.

The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.

Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.


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