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Published on Jun 2, 2014
Table of Contents: 00:09 Lecture 3.4: AFM Calibrations 00:33 Four Calibrations 01:41 How do you know the spring constant of the cantilever? 03:45 Why the variability in k? 06:02 Recent Study Involving Ten Different AFMs 07:27 Remaining Issues for Careful Work 10:00 Calibration of the sensitivity S of the optical system 14:36 Calibration and orthogonality of X and Y scanners 16:40 Non-linearity in the X and Y piezo scanners 18:17 X-Z and Y-Z coupling of scanners 20:59 Calibration of Z piezo 22:57 Non-linearity in the z-piezo 24:28 Important Issue: AFMs located in multi-user central facilities 25:49 Up Next: Contact Mode Scans
Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.
The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.
Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.