nanoHUB-U Fundamentals of AFM L2.6: Tip-Surface Interactions (Contact) - Hertz, JKR, DMT





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Published on Jun 2, 2014

Table of Contents:
00:09 Lecture 2.6: Combining contact mechanics with intermolecular ...
00:45 How to Model?
02:20 The infinitely hard tip/sample with no surface forces
03:48 Hertz Contact - indentation, no surface force
07:05 Combining van der Waals force & DMT contact
08:23 DMT Contact -- indentation and surface forces
10:26 JKR Contact
13:09 The model you choose must fit your experiments
14:12 Plots of a few VEDA models
15:09 Week 3: Brief introduction to VEDA plus discussion of AFM ...

This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 1 Fundamental Aspects of AFM. (https://nanohub.org/courses/AFM1)

Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.

The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.

Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.


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