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Published on Jun 2, 2014
Table of Contents: 00:09 Lecture 2.6: Combining contact mechanics with intermolecular ... 00:45 How to Model? 02:20 The infinitely hard tip/sample with no surface forces 03:48 Hertz Contact - indentation, no surface force 07:05 Combining van der Waals force & DMT contact 08:23 DMT Contact -- indentation and surface forces 10:26 JKR Contact 13:09 The model you choose must fit your experiments 14:12 Plots of a few VEDA models 15:09 Week 3: Brief introduction to VEDA plus discussion of AFM ...
Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.
The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.
Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.