nanoHUB-U Fundamentals of AFM L5.4: Computer Simulations using VEDA - Contact Mode Scanning II





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Published on Jun 2, 2014

Table of Contents:
00:09 Lecture L5.4: Contact Mode Scanning Simulations with VEDA
00:32 Contact Mode Scanning in VEDA
04:06 In this simulation, select "Sinusoid" for the geometric feature
05:42 Example 1:
07:46 Echo Input File
08:18 Effect of Feedback Gain
09:38 Effect of Scan Speed
11:19 Error in Topography vs. Scan Speed
12:08 Include Tip Dilation (use 20 lines/s scan rate)
13:21 Example 2:
14:37 instructions
15:43 Include Tip Convolution (use 10 lines/s scan rate)
17:36 Example 3:
18:33 Measured Topography
20:39 Up Next: Adjusting the feedback gains P and I

This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 1 Fundamental Aspects of AFM. (https://nanohub.org/courses/AFM1)

Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.

The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.

Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.


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