 X-ray photoelectron spectroscopy, XPS, is a powerful tool for studying the chemical modification of surfaces, particularly the distribution and bonding of heteroatom dopants and carbon nano materials such as graphene and carbon nanotubes. Nitrogen and boron are the most commonly studied dopants, while phosphorus is becoming increasingly popular. Hundreds of studies have been conducted using XPS to analyze the concentration and bonding of dopants in various materials. Care must be taken when preparing samples, considering the intrinsic photoemission response of the material, and performing spectral analysis. Misinterpretations of data can lead to incorrect conclusions about the dopants bonding configuration, which is critical for understanding how dopants affect the material's properties. This review provides a practical guide for interpreting XPS data of doped, graphitic carbon nanomaterials, and a reference for their binding energies. This article was authored by Thomas Susie, Thomas Pitchler, and Paula Ayala. We are article.tv, links in the description below.