 The FEI Titan G280-200 Krulli is a powerful transmission electron microscope, TM, designed to investigate solid state phenomena occurring on the atomic scale. It features a Schottky type high brightness electron gun, a CS probe corrector, an in-column super-X energy dispersive x-ray spectrometer, EDX, a post-column energy filter system, two electron energy law spectroscopy, ELS, options, an angular dark field, ADF, scanning TM, STEM, detector, 3-on-axis BF slash DF detectors, a 4 megapixel CCD system, and a 1000 spectra per second data acquisition rate. This combination of technologies allows researchers to study materials from the atomic level up to the nanoscale. This article was authored by Andres Kovacs, Roland Schierholz, and Carsten Tillman.