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Published on Jun 2, 2014
Table of Contents: 00:09 Lecture L3.6: The AFM as a System 00:53 Important System (Electronic) Signals 02:11 Set a long-term goal 03:22 Environmental Characterization: Floor Vibrations 05:33 Vibration Standards (1 - 100 Hz) 05:45 Environmental Characterization: Acoustic Noise 07:18 Environmental Characterization: Thermal Stability 09:15 Characterizing the z-Noise in Your AFM System 11:51 The ability to obtain time-series data at various points 12:58 Characterizing the Photodetector Sensor Noise in Your AFM System 14:37 Estimate the height resolution of your AFM? 16:28 Characterizing the Thermal Noise in Your AFM System 19:40 Thermal Stability 21:29 Laser System 23:33 Next Up: Cantilever Mechanics
Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.
The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.
Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.