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nanoHUB-U Fundamentals of AFM L4.6: Reconstructing Surface Forces - Results on Force Spectroscopy

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Published on Jun 2, 2014

Table of Contents:
00:09 Lecture 4.6: Further Results on Force Spectroscopy
00:24 From the last lecture
01:40 Dissipation spectroscopy with FM-AFM
07:23 Force spectroscopy with AM-AFM or Tapping mode?
09:13 Force spectroscopy with AM-AFM
11:32 Reconstruction in the small amplitude limit
16:54 Other approaches
20:23 Other approaches
23:41 Other approaches

This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 2 Dynamic AFM Methods. (https://nanohub.org/courses/AFM2)

Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.

The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.

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