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Published on Jun 2, 2014
Table of Contents: 00:09 Lecture 4.4: Processing Force Curves 01:19 The Basic Force vs. z-Displacement Experiment 03:55 I. Infinitely hard materials, no surface forces 11:24 II. Infinitely hard sample/tip, repulsive surface force 15:28 III. Soft material, no surface forces 19:41 Calibration on hard sample 21:29 infinitely hard sample 22:33 Errors Can Be Large When Measuring Deformation 23:12 Force spectroscopy -- an example 24:15 Artifacts when measuring cantilever deflection vs. z-displacement 25:37 Artifacts when measuring cantilever deflection vs. z-displacement 26:35 Artifacts 27:08 Simulations: Force-Distance Outputs in VEDA 27:47 Up Next: Modulus and Adhesion Maps
Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.
The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.
Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.