 Amorphous materials are composed of atoms arranged in a random pattern with no discernible order or symmetry. This makes them difficult to characterize using traditional techniques like X-ray diffraction, neutron diffraction, and electron diffraction. However, recent advances in electron tomography have allowed researchers to obtain detailed images of the atomic structure of these materials. Electron tomography uses electrons instead of light to image the material, allowing for higher resolution than other techniques. By combining these images with computer simulations, researchers can reconstruct the 3D atomic structure of amorphous materials. This article was authored by Xie Zhiheng, Zhang Yao, Huang Siwei, and others.