 Abstract silicon is a promising negative electrode material for high-energy-density leion batteries, LIBS. However, it suffers from significant degradation due to mechanical stress caused by lithiation. This stress causes volume expansion and lithiation in silicon, which is strongly anisotropic. Understanding this process and its implications on electrode performance remains poorly understood. To address this issue, researchers developed a new correlative electrochemical microscopy technique to study local interfacial degradation at the early stages of lithiation for three different surface orientations of silicon single crystals C100C110 and C311. The experimental strategy combined scanning electrochemical cell microscopy, SECCM, measurements with subsequent scanning transmission electron microscopy, STEM, images of high-quality cross-sections of silicon electrodes, extracted at selected SECCM regions, using a novel-save plus plasma-focused ion beam procedure. These studies revealed significant surface orientation-dependent nanoscale degradation mechanisms that strongly controlled electrode performance. C10 This article was offered by Daniel Martin-Yerga, Nibbari, Matthew E. Curd and others. We are article.tv, links in the description below.