 This paper proposes a novel approach for developing anti-counterfeiting labels using diamond microparticles containing silicon vacancy centers. The diamonds are grown on silicon substrates through chemical vapor deposition, making them easy to produce at scale. The unique properties of these particles make them resistant to extreme conditions such as high temperatures, chemicals, and mechanical abrasions. Additionally, the particle's photoluminescent properties allow for the encoding of information which cannot be replicated or cloned. This makes the labels extremely difficult to counterfeit. This article was authored by Tongtong Zhong, Lingji Wang, Jing Wang, and others.