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Published on Jun 2, 2014
Table of Contents: 00:09 Lecture 2.5: Contact Mechanics Predict the stresses and ... 01:17 Action of a point force (Boussinesq, 1885) 02:33 Action of a punch with circular cross-section 03:27 Action of a cone-shaped punch 04:16 At a microscopic scale, for small indentations. . . . 05:07 The basic problem 06:51 Need to Develop a Tip-sample Interaction Model 08:31 elastic, with adhesion in contact region 10:29 Surface forces give rise to surface energies 12:37 Standard results 15:33 JKR Adhesion - consequences 17:47 Example 21:10 Which contact model to choose? 22:05 Validity of different models 23:27 Transition from DMT to JKR: Maugis-Dugdale Theory 24:59 Up Next: Combining contact mechanics with intermolecular interactions
Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.
The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.
Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.