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nanoHUB-U Fundamentals of AFM L4.1: Force Spectroscopy - The Force Sensor

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Published on Jun 2, 2014

Table of Contents:
00:09 Lecture: 4.1: Cantilever Mechanics -- The Force Sensor
00:58 Week 4 Overview
02:01 The Loaded Microcantilever
05:17 The problem: What is y(x)?
08:57 Internal moments develop because of internal stresses
10:55 AFTER (curvature greatly exaggerated)
14:57 Review - defining the curvature of a line
17:33 Deflection (y) vs. x:
20:36 Notation
21:13 Profile of cantilever
21:44 Linear and Angular Deflection Plots
22:43 Implications -- Resonant Frequency
24:16 Summary
25:45 Up Next: Tip Approach to the Substrate

This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 1 Fundamental Aspects of AFM. (https://nanohub.org/courses/AFM1)

Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.

The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.

Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.

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