 제가 시간을 제공할 수 있습니다. 한국의 경험을 시작합니다. 한국에 대해 이야기할 수 있습니다. 나노테코노러지와 파크 시스템을 제 own company에 대해 이야기할 수 있습니다. 그리고 국민들과의 예를 들었습니다. 그때부터 한국 정부의 권력을 공개하려는 것에 대해 설명을 드렸던 것입니다. 그런데 제가 알아냈다는 것에 대한 계획은 없었지만 제 자신의 스토리에 대해 말할 것입니다. 한국은 엄청난 나라입니다. 이 년에 한국의 populace가 50만 명을 얻을 수 있었습니다 이 년에 한국은 20, 20, 50시간이 되었기 때문입니다 약 20,000억 원의 돈을 얻을 수 있으며 50만 명의 populace를 얻을 수 있습니다 국가, 일본, 일본, 미국, 프랑스, 이를리, 미국, 한국은 7명이였습니다. 한국에서 한 몇 년의 월드클라스 인디스트리가 있습니다. 시스푼, 스마이컨덕터, 스틸, 오토모벨, and consumer electronics가 있습니다. 한국은 2010년에 G20 송인 미닉을 제공했습니다. 2009년에 한국은 10대가 가장 높은 인폴터와 10대가 가장 높은 인폴터를 제공했습니다. 한국은 다음 11대의 국가에서 가장 높은 인폴터와 가장 높은 인폴터를 제공했습니다. 한국은 1960-1990년대에서 가장 빠른 경험이었어요. 50년 전, 한국은 아무것도 없었어요. 한국의 세계에서 다가온 모든 것을 다가왔어요. 인도실도 없었죠. 국민도 없었죠. 많은 사람들도 없었죠. 그래서 생각하자마자 도움이 되었다는 점은 정말 대단한 것입니다 그리고 몇 명의 사람들은 한-리버의 미라클이라고 불렀습니다 하지만, 이런 것처럼 미라클이 필요없는 것입니다 전략적인 인류트라이저이션은 전략적인 프로젝트였죠 FastFollower에 관한 것이었죠 기술영장은 전부 시업이 도전성에 전해� Dit, 바이러스, 능력, 기술 영향은 전해지고, 경제와 labor이 아주 높은 수준을 받았다고 합니다. 한국은 새로운 경제에 맞춰서 세계가 몇 개의 대선을 배우는지 4라운드의 고향을 가진 것입니다. 다른 나라가 없을 때 새로운 기술을 만들어야 합니다. 이 기술은 더 나름한 기술을 가진 것입니다. 또한 또한 소셜의 문제는 경기 폴라리지어에서의 깊은 문제입니다 예를 들어, 플루토크라틱, 래퍼디즘, 래퍼디즘 그리고 슈퍼리치 vs 랩 그리고 지니의 효과는 계속 늘어납니다 그래서 새로운 글라스 모델이 필요합니다 그리고 저는 믿을 수 있습니다 매니저리아의 경험과 엉트로프리네리아의 경험에 관여해야 합니다. 엉트로프리네리아의 경험은 future industry에서 가장 중요한 것입니다. 그리고 엉트로프리네리아의 경험에 응원할 수 있어야 합니다. Indeed, new industry is created by entrepreneurial companies like this. Let me move on to R&D strategies. R&D policies were mostly industry demand oriented at the beginning in the 60s and 70s and later it became science and technology oriented. The key industry was primary industry, light industry and later it became heavy and electronics and transportation. Korea government keep increased its R&D budgets about 10% each year. So in the year 2010, it reached about 12.4 billion US dollars. Including private sectors, the total R&D expenditure in Korea is number 7. It's exactly the same as Dr. Charlie Weiss data. Depends on the date, it can be slightly different. US, Japan, Germany, France, UK and China is either of us. But if we count the number of researchers, Korea is in fact ahead of the UK and France. The current president, Lee Myeong-bak declared low carbon green growth policies. Strategic green energy technology roadmap was created by considering market attraction and technical importance for a few segments. So now 10 core technology was chosen as the new growth engine that includes photovoltaic fuel cell, battery, green car, LED, smart grid, green IT carbon capture and storage, water treatment and future nuclear. We know how important the nanotechnology is. Most of the future technology development is based on nanotechnology progress. We need to understand what's going on in a small scale and we have to utilize such knowledge. So Korea started its nanotechnology initiative program from year 2001 and now we are in its third phase. And Korea government invested over 200 million dollars every year for the last decade. And there was three major R&D projects in nanotechnology, including nanodevices, nanomaterials and nanomechatronics. All of them are about 100 million dollar project over 10 years. And six national nanofacility was built around the country. And as a result, the nanotechnology related paper was keep increasing, the publication number was keep increasing. And we are number three after China and US. Patent application shows similar trend. Keep increasing after China and US, we are number three. According to LUX research data, Korea is regarded one of the most dominant and active country in nanotechnology research. Let me move on park systems. We make SPMs, scanning probe microscope. And SPM is really the key that opened the world to the nanoworld. The first member of SPM is scanning tunneling microscope. With STM, we can see individual atoms and we can move, relocate individual atoms. Atomic force microscope became more important than first STM. It really kicked off the nanotechnology era. AFM was invented at Professor Kelvin Kreitz Laboratory at Stanford University when I was his student. So I was very fortunate. After graduation, I started the first AFM company in 1988, the name Park Scientific and Romance. And current park system is my second company I started. The mission is to be the nanotechnology solutions partner. We started in 1997, there are about 120 people. And our headquarters is in metropolitan Seoul. We have offices in California, Japan, Singapore and we have application lab in Frankfurt. We have full product line of AFM, both research AFM and industrial AFM. I don't have time to go through all the detail, but this is basically the conventional AFM structure. Basically, we measure interatomic force between the tip and sample. And we scan the sample in x, y and z direction with tube scanner, piezoelectric tube scanner. The problem of this conventional AFM is, this tube scanner is not an ideal orthogonal 3D actuator. So there is a cross talk when you move x or y, it affects z and vice versa. So even with a flat sample, it doesn't look flat, even after software correction. Another major problem is this tube scanner is very hollow, weak structures mechanically. So it do not have fast enough g-servo capability and that is very fatal for noncontact mode AFM. So the AFM technology innovation we developed at Park System is, let's get rid of this tube scanner and use fracture scanner. With the fracture scanner, we can get very flat scans. The scan size is about 80 x 80 micrometer and the total run out g motion is well within 1 nanometer. And this step piezo also provides very fast g-servo capability so we can achieve true noncontact mode, practical. Compared to tapping mode, noncontact mode use much small amplitude and we minimize tip sample interaction. So the sample does not damage it or modified and the tip life is much longer. For example, this chromium nitrate sample is very spiky and abrasive and if you use tapping mode, the tip wear out rather fast. So after a few images, the image looks dull because the tip is blunt. In noncontact mode, the tip remains sharp. It sharpness after a few hundred images. Since we can preserve the very sharp end of the tip, we can get higher resolution images. And noncontact mode AFM, we detect the tip sample interaction not only at the end of the tip but also on the side of the tip. So as it approaches to a vertical wall, it can sense the interaction and quickly withdraw and it can climb up. This is an example. The trench depth is 3.7 micrometer. And we can go for industry. We can image LED lens array and silicon patterns, narrow and deep trenches. Okay, let me go for examples of international cooperation. The first one is a programmable data density. Our customers see a normal day in US. They use our AFM to characterize the slide head of hard disk. The read-write head of hard disk has a cutting edge nanostructure. They are fighting for 0.1 nanometer. And they use our AFM to measure the height. Pole tip, read tip and write tips. But as the tip gets smaller, data is getting smaller and smaller, the pole tip, write tip is not visible. That's a problem. So we developed something called programmable data density. And what that is is not unlike a normal scan, we increase the scan line density in the region of interest and fire more pixels. So we get both higher pixel density in the region of interest. So we effectively magnify the region of interest. Now the rider pole is clearly visible. And this is very important because we need to measure the height of this rider pole compared to the ABS area. You cannot zoom in and re-image this AFM data. It have to be done in once. Another example is done with the Seagate Fremont, again from US. They make hard disk media and reviewing the defect is a very important task. And the defect is getting smaller and smaller. And AFM is about the only tool which can characterize exact shape. So far, they use the media with the laser scan system, and that laser scanner generate defect maps, only coordinate in R-SATA coordinate. And then they bring it to the optical inspection system and mark manually where is the defects are with the hyper optical microscope. And by using this marker, they bring to AFM and image what the defect look like. Very tedious, very tedious labor is intensive. So what we did was we converted R-SATA coordinate to XY coordinate in our AFM stage with reference marker. It appears simple in theory, but practically it involves lots of engineering if you consider all the errors, possible source of errors. But we did it. And we can generate all those defect image automatically, unattended. There are a few hundreds. So I cannot go through all those 450, 484. So the example is about 3D AFM. Our customer, TDK in Asama, Japan, they brought up this sample. Can we measure this top width, middle width, and bottom width with AFM? I said no. AFM can image only the visible surface from the top because the AFM tip approach from the top. But they have a very burning issue. They really want to measure those width and angle and sidewalk roughness and so on. And it is not only from TDK. It's coming asking by other hard disk industry and semiconductor industry. So after a regular brainstorming, we thought, Well, perhaps if we rotate the head, the G-axis can move up and down while we can scan sample in X directions and as we scan from the right side to the left, we can get at least one side, right? And rotate the head from the other direction and do the same thing, scan from the left to the right and we can combine those two or three images taken from the top. And in order to do that, we had to develop a new special head, very narrow head and then special tip so that we have to make sure other parts of the probe do not touch the sample. This is actual photo of the instrument. Head is sitting at the center, rotate to the left, rotate to the right and we can get very nice result. Of course, it took many years of engineering. Image from the left, center, and right those three lines and we can merge all those. You can guess. And of course, we can get a very nice 3D rendering image. Okay, the next example is a polymer pan lithography. This was done with a purpose of tread marking at Northwestern University in the U.S. This PPL has a good potential to become a practical nano manufacturing. But they require precise leveling of the pan array and good optical vision from the top. So we had to modify and develop a special platform for them and they liked it very much. It was very productive so they get great result and they appreciate us many, many times if you read the nature paper. The last one is scanning iron conductors microscope. This is for biology application and we got good result with NIGATA University in Japan. For biologists, they want to see samples sitting inside Petri dish and we use nano pipette instead of AFM probe. And this SICM do not apply any physical force so we can get precise image of the sample. Very pristine condition. Very nice images in liquid. Red trachea cells is compared very well with SICM image and this is much easier to get compared to this and this is dead, it's dried, fixed. You cannot do any further experiment. We can even image live cells. Hela cells, the famous cancer cells and this is the first time that we... I mean the live cell surface was imaged because if you consider live cells you cannot use no other technique but optical microscope which do not have enough resolution. But with SICM we were able to image beautiful surface. Look at how complex the membrane looks. And also we can do patch clamping recording so we can go specific point and measure its ionic current. So in conclusion Korea has achieved spectacular industrialization and government-driven economic development program played a key role. R&D has been the national agenda in Korea nanotechnology is the basis of future technology. PARC system is a nanotechnology solutions partner providing the most advanced AFM and SPMs. True non-contact mode AFM, 3D AFM and SICM will open a new horizon for nanoscale measurement and characterization. And lastly we are looking for new partners in Europe. Thank you very much for your attention.