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nanoHUB-U Fundamentals of AFM L3.6: Dynamic AFM using VEDA -Frequency Modulation AFM

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Published on Jun 2, 2014

Table of Contents:
00:09 Lecture 3.6: Frequency Modulation AFM in VEDA
00:22 From the last lecture
01:32 Problem 1: FM-Approach curves
03:15 Results: Amplitude change
04:35 Results: Phase change
05:11 Results: frequency shift
05:59 Problem 2: FM-Scanning
08:44 Results: Measure topography
09:05 Results: First harmonic amplitude
09:30 Results: First harmonic phase
09:48 VEDA Results: FM Feedback
10:28 Results for Bad controller parameters

This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 2 Dynamic AFM Methods. (https://nanohub.org/courses/AFM2)

Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.

The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.

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