 The paper presents a benchmarking suite for mid-circuit measurements in quantum information computing protocols that can detect and quantify errors on both measured and spectator qubits, including measurement-induced errors on spectator qubits and entangling errors between measured and spectator qubits. The scalability of the suite is demonstrated by simultaneously characterizing mid-circuit measurement on multiple qubits from an IBM Quantum Falcon device, and numerical simulations are used to support experimental results. Additionally, a mid-circuit measurement tomography protocol is used to establish the nature of errors identified by the benchmarking suite. This article was offered by L. C. G. Govia, P. Giusevic, C. J. Wood, and others.