nanoHUB-U Fundamentals of AFM L2.1: Tip-Surface Interactions (Contact) - Hamaker





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Published on Jun 11, 2012

Due to technical difficulties, this lecture was not Closed Captioned by the nanoHUB-U team.

Table of Contents:
00:09 Lecture 2.1 Integrating inter-molecular forces to estimate the force ...
01:00 Week 2 Overview
01:55 The Program -- integrate molecule-molecule interaction over ...
02:58 What we already know
04:58 One molecule interacting with a flat plane
08:19 Working out the math
11:01 Number Densities of the Elements
11:35 A sphere interacting with a flat plane
12:49 From one molecule to a sphere
16:34 Order of Magnitude
17:52 Can we do better?
21:49 The frequency dependence of the dielectric constant
24:27 The Lifshitz result is useful
25:34 Typical Values for Hamaker Constants, H
26:39 Summary
27:17 vdW interactions between macroscopic objects depends on geometry
28:04 From intermolecular to macroscopic
29:14 Up Next: Discussion of the surface energy of a material and its ...

This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 1 Fundamental Aspects of AFM. (https://nanohub.org/courses/AFM1)

Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.

The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.

Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.


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