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Published on Jun 11, 2012
Due to technical difficulties, this lecture was not Closed Captioned by the nanoHUB-U team.
Table of Contents: 00:09 Lecture 2.1 Integrating inter-molecular forces to estimate the force ... 01:00 Week 2 Overview 01:55 The Program -- integrate molecule-molecule interaction over ... 02:58 What we already know 04:58 One molecule interacting with a flat plane 08:19 Working out the math 11:01 Number Densities of the Elements 11:35 A sphere interacting with a flat plane 12:49 From one molecule to a sphere 16:34 Order of Magnitude 17:52 Can we do better? 21:49 The frequency dependence of the dielectric constant 24:27 The Lifshitz result is useful 25:34 Typical Values for Hamaker Constants, H 26:39 Summary 27:17 vdW interactions between macroscopic objects depends on geometry 28:04 From intermolecular to macroscopic 29:14 Up Next: Discussion of the surface energy of a material and its ...
Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.
The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.
Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.