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In situ template stripping via focused ion beam (FIB)

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Published on Sep 2, 2011

Focused ion beam (FIB) video of the in situ template stripping process. Both a rectangular and a circular silver patch (~30 microns across) are stripped out, which can then be placed elsewhere in the chamber for further imaging, characterization, or micro- & nanomachining.

Source:
http://dx.doi.org/10.1021/nl2005737

N.C. Lindquist et al., Nano Letters (2011)

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