nanoHUB-U Fundamentals of AFM L5.1: Computer Simulations using VEDA - Force-Distance I





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Published on Jun 2, 2014

Table of Contents:
00:09 Lecture 5.1: Force-Distance Simulations with VEDA
01:26 Week 5
02:02 A Few Comments
05:44 Check out the complete VEDA manual
08:01 Force-Distance Simulations using VEDA
09:31 The Force Distance Module
10:36 Many Simulations are Possible
12:00 Simulation results - magnified
13:20 Example 1:
14:41 Echo Input File
15:46 Results
17:36 Magnified near Jump-to-Contact; include infinitely hard sample
19:04 Indentation Plot
19:42 Tip-Sample Gap
22:03 Example 2:
23:11 Up Next: Force-Distance Simulations using the JKR Model ...

This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 1 Fundamental Aspects of AFM. (https://nanohub.org/courses/AFM1)

Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.

The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.

Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.


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