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Published on Jun 2, 2014
Table of Contents: 00:09 Lecture 5.1: Force-Distance Simulations with VEDA 01:26 Week 5 02:02 A Few Comments 05:44 Check out the complete VEDA manual 08:01 Force-Distance Simulations using VEDA 09:31 The Force Distance Module 10:36 Many Simulations are Possible 12:00 Simulation results - magnified 13:20 Example 1: 14:41 Echo Input File 15:46 Results 17:36 Magnified near Jump-to-Contact; include infinitely hard sample 19:04 Indentation Plot 19:42 Tip-Sample Gap 22:03 Example 2: 23:11 Up Next: Force-Distance Simulations using the JKR Model ...
Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.
The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.
Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.