 The study investigates the effect of laser pulse parameters on the accuracy of laser-assisted atom probe tomography, APT, for a teal and thin film, and shows that increasing the electric field strength from approximately 25 to 28 V Nm-1 improves the accuracy of absolute concentrations measured by APT. The smallest compositional discrepancies between ion beam analysis and APT are obtained for the maximum electric field strength of approximately 28 V Nm-1 at 10 Pj laser pulse energy due to enhanced ionization of neutral fragments caused by the increased electric field strength. This article was authored by Markus Hans and Johann M. Schneider.