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Published on Jun 2, 2014
Table of Contents: 00:09 Lecture 2.4: Elasticity of Materials 00:52 Nanomechanics - what happens at contact? 03:36 External Forces Deform Solids 06:13 Young's Modulus of the Elements 07:08 Young's Modulus by material class 08:19 Young's Modulus -- various materials 09:11 A normal stress produces strains in lateral directions 10:35 Poisson's Ratio for the Elements 11:06 Poisson's Ratio by material class 12:02 Example: A cube of material 25 mm on a side 14:28 Microscopic Model for Young's Modulus 17:06 Correlation with atomic interaction potentials (Lennard-Jones) 18:55 Near z=ao, an atom will obey Hook's Law 20:33 Example: for Au atoms 21:59 Up Next: An Introduction to Contact Mechanics
Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.
The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.
Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.