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Published on Jun 2, 2014
Table of Contents: 00:09 Lecture5.6: Image Artifacts 02:05 Good Tips 03:06 Real Tips 03:43 Tip Imaging Artifacts 05:41 Double Tip Image 06:22 The Tip Dilation Algorithm 08:37 Apparent width of small object 10:02 Summary: Tip Artifacts 11:04 Sometimes, special tip shapes are required 12:14 Tip Care 14:30 Microstructure of Metal Coating 15:29 How do you know the tip is dirty? 18:36 Tests for Scanning Artifacts (The R3C2 Rule) 21:16 Tip/Cantilever Recommendations 24:24 Concludes Part I Up Next: Part II -- Dynamic AFM 25:12 Aspects of AFM covered in Part II
Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.
The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.
Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM. .