nanoHUB-U Fundamentals of AFM L5.6: Computer Simulations using VEDA - Image Artifacts





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Published on Jun 2, 2014

Table of Contents:
00:09 Lecture5.6: Image Artifacts
02:05 Good Tips
03:06 Real Tips
03:43 Tip Imaging Artifacts
05:41 Double Tip Image
06:22 The Tip Dilation Algorithm
08:37 Apparent width of small object
10:02 Summary: Tip Artifacts
11:04 Sometimes, special tip shapes are required
12:14 Tip Care
14:30 Microstructure of Metal Coating
15:29 How do you know the tip is dirty?
18:36 Tests for Scanning Artifacts (The R3C2 Rule)
21:16 Tip/Cantilever Recommendations
24:24 Concludes Part I Up Next: Part II -- Dynamic AFM
25:12 Aspects of AFM covered in Part II

This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 1 Fundamental Aspects of AFM. (https://nanohub.org/courses/AFM1)

Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.

The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.

Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.


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