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Electron beam control in a scanning electron microscope

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Published on Apr 10, 2014

I describe electron beam optics and deflection as they are employed in scanning electron microscopy.

http://web.jfet.org/vclk/ - Deflection amplifier

http://www.johngineer.com/blog/?p=648 - CRT Christmas tree

http://www.fei.com/ - FEI Company

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