 X-ray phase contrast imaging and tomography are two techniques that utilize the refraction of X-rays by the sample in order to generate images. These techniques provide additional information compared to conventional X-ray imaging methods, which only measure X-ray absorption by the sample. Phase contrast imaging highlights edges and internal boundaries of a sample, making it complementary to absorption contrast, which is more sensitive to the bulk of the sample. Additionally, phase contrast can be used to image low-density materials, which do not absorb X-rays sufficiently to form a conventional X-ray image. In the context of material science, X-ray phase contrast imaging and tomography have particular value in the 2D and 3D characterization of low-density materials, the detection of cracks and voids, and the analysis of composite and multi-phase materials. Furthermore, these techniques can be applied to both synchrotron and laboratory sources, providing a versatile tool for materials scientists. This article was authored by Sheridan C. Mayo, Andrew W. Stevenson, and Stephen W. Wilkins. We are article.tv, links in the description below.