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Scanning Electron Microscope: Pt 5 of 6

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Published on Jan 19, 2010

The scanning electron microscope is used to image the surface of a conducting sample by scanning it with a high energy beam of electrons. Some SEMs have additional software enhancements than enable them to focus the beam on a photomask for E-beam lithography or are equipped for focused ion beam (FIB) milling.
This video is part 5 of a 6-part series.

More information on the CMDITR wiki:
http://depts.washington.edu/cmditr/me...

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