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Published on Jun 2, 2014
Table of Contents: 00:09 Lecture 5.2: Force-Distance Simulations with VEDA: JKR Model ... 01:08 VEDA has a number of examples preloaded 02:42 JKR approach and retract curves 04:29 Zoom in on features of interest 04:44 Plot after enlarging 05:55 Example 1: 07:40 Cantilever Deflection vs. z 09:46 Example 2: 11:44 Echo Input File 13:30 Force vs. z 15:16 Does the observed cantilever deflection depend on elastic modulus? 17:23 Indentation vs z (vary Esample) 18:50 Up Next: Contact Mode Scanning
Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.
The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.
Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.