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Published on Jun 2, 2014
Table of Contents: 00:09 Lecture 4.6: Lateral Force Microscopy (LFM) 01:22 Friction 03:00 Lateral Force Microscopy 05:25 Twisting a Cantilever 08:50 Spring Constants for Lateral Force 09:44 Comparing Spring Constants 10:07 Assuming a perfectly isotropic and homogenous material, G is ... 11:41 Two Issues in Lateral Force Microscopy 13:21 Accounting for All the Forces 14:55 Uncalibrated Frictional Force Maps 16:20 The lateral forces can be large 17:41 How to Generate a Known Lateral Force? 19:03 Lateral Signal vs. Loading Force 20:49 Calibration relies on many assumptions 22:46 The Friction Loop 24:27 Friction Loops on Sloped Surfaces 25:16 Alignment of photodiode is important 27:09 Atomic scale friction: Stick/Slip 28:27 Up Next: Week 5 - VEDA Simulations
Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.
The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.
Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.