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nanoHUB-U Fundamentals of AFM L4.6: Force Spectroscopy - Lateral Force Microscopy (LFM)

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Published on Jun 2, 2014

Table of Contents:
00:09 Lecture 4.6: Lateral Force Microscopy (LFM)
01:22 Friction
03:00 Lateral Force Microscopy
05:25 Twisting a Cantilever
08:50 Spring Constants for Lateral Force
09:44 Comparing Spring Constants
10:07 Assuming a perfectly isotropic and homogenous material, G is ...
11:41 Two Issues in Lateral Force Microscopy
13:21 Accounting for All the Forces
14:55 Uncalibrated Frictional Force Maps
16:20 The lateral forces can be large
17:41 How to Generate a Known Lateral Force?
19:03 Lateral Signal vs. Loading Force
20:49 Calibration relies on many assumptions
22:46 The Friction Loop
24:27 Friction Loops on Sloped Surfaces
25:16 Alignment of photodiode is important
27:09 Atomic scale friction: Stick/Slip
28:27 Up Next: Week 5 - VEDA Simulations

This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 1 Fundamental Aspects of AFM. (https://nanohub.org/courses/AFM1)

Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.

The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.

Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.

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