TEM inspection of the electromigration process (Delft University of Technology). More about this work can be found at:
In situ imaging of electromigration-induced nanogap formation by transmission electron microscopy. H.B. Heersche, , G. Lientschnig, K. Oneill, H.S.J. van der Zant and H.W. Zandbergen. Appl. Phys. Lett. 91, 72107-1-72107-3 (2007).
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