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Uploaded by nationalinstruments on Jul 23, 2007
利用NI的High speed DIO模組化儀器,提供高速訊號轉換來完成TFT LCD的畫面檢測,因為TFT LCD每個frame裡gate line 和source line的訊號切換時間高達幾十個microsecond,運用PXI-6542高達100MS/s的高sampling rate特性可以提供TFT LCD高速的靜態以及動態訊號,使TFT LCD除了一般的亮暗點和線缺陷的檢測外,更可以達到mura,flicker,動態模糊等進階光學量測..
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