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Grazing Incidence X-Ray Diffraction of InAs NW

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Uploaded by on Feb 9, 2010

X-ray diffraction of InAs vertically free-standing nanowire grown on GaAs (111)B. The Hubbler diffractometer was setting up to measure in Grazing Incidence X-Ray Diffraction (GIXRD or GID) on (2,-2,0) direction. The InAs islands, nanowires and GaAs substrate peaks can be seen.

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  • nah man i am just joking that is uber cool! man super stereo type man! oh yeah nerdgasms nerdgasms oh yeahhhhh nerdgasmic video

  • thats gay

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