X-ray diffraction of InAs vertically free-standing nanowire grown on GaAs (111)B. The Hubbler diffractometer was setting up to measure in Grazing Incidence X-Ray Diffraction (GIXRD or GID) on (2,-2,0) direction. The InAs islands, nanowires and GaAs substrate peaks can be seen.
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finboarder 5 months ago
thats gay
finboarder 5 months ago